DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used.

DUT boards are occasionally known as DIBs ( Device Interface Boards ), probecards, or PIBs ( Probecard Interface Boards ).

Inductive ( magnetic ) and capacitive ( electric ) field strengths are near-field effects, and are only important if the device under test ( DUT ) is designed for location close to other electrical equipment.

The logic values observed at the device's primary outputs, while applying a test pattern to some device under test ( DUT ), are called the output of that test pattern.

One type of DUT board is used in testing the individual die ( or dice ) of a silicon wafer before they are cut free and packaged, and another type is used for testing packaged IC's.

The instruments perform different measurements on the DUT, and the instruments are synchronized so that they source and measure waveforms at the proper times.

RF and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test ( DUT ).

Recipients of the Order are entitled to place the post nominals DUT ( x ) after their names, with ( x ) being the grade of the Order awarded.

Transient immunity is used to test the immunity of the DUT against powerline disturbances including surges, lightning strikes and switching noise.

Typically a spectrum analyzer is used to measure the emission levels of the DUT across a wide band of frequencies ( frequency domain ).

Finally, a socket is used to bridge the connection between the ITA and the DUT.

Some resources can be used in parallel, others must be serialized to each DUT.

ATE systems typically interface with an automated placement tool, called a " handler ", that physically places the Device Under Test ( DUT ) on an Interface Test Adapter ( ITA ) so that it can be measured by the equipment.

A DUT board is a printed circuit board, and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment ( ATE ).

In other words, the response of vectors ( patterns ) from a good circuit is compared with the response of vectors ( using same patterns ) from a DUT ( device under test ).

Radiated field susceptibility testing typically involves a high-powered source of RF or EM pulse energy and a radiating antenna to direct the energy at the potential victim or device under test ( DUT ).

At minimum, a testbench contains an instantiation of the model ( called the device under test or DUT ), pin / signal declarations for the model's I / O, and a clock waveform.

DUT connectivity is reserved for the front of the module, with line power and Ethernet IO on the rear panel.

As the largest institution of higher education in Liaoning Province in terms of student enrollment, Dalian University of Technology ( DUT ) is renowned in China for its rigorous training in engineering and science.

DUT is the home to three national key laboratories, State Key Laboratory of Structural Analysis for Industrial Equipment, State Key Laboratory of Coastal and Offshore Engineering, State Key Laboratory of Fine Chemicals and the home to three Education Ministry Key Laboratories, Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Key Laboratory of Technology Precision and Non-traditional Machining and Key Laboratory of Industrial Ecology and Environmental Technology.

Since 1978, DUT has won almost 1, 000 awards for its achievements in scientific and technological researches, eleven of which were National Natural Science Awards, nine National Invention Awards, and 30 awards in science and technology.

The previous Chairman, Jiang Zemin, once visited DUT and said that this was a great place for studying and doing research.

DUT is an acronym for

Group delay is a useful measure of time distortion, and is calculated by differentiating, with respect to frequency, the phase response versus frequency of the device under test ( DUT ).

Phase noise can be measured using a spectrum analyzer if the phase noise of the device under test ( DUT ) is large with respect to the spectrum analyzer's local oscillator.

In this way, the proper operation of the DUT can be proven or faults in the device can be traced and repaired.

In the example above, while the device under test ( DUT ) is under production load-100 VUsers, run the target application.

Sandwiched between them is the device under test ( DUT ) that is being measured.

Automatic or Automated Test Equipment ( ATE ) is any apparatus that performs tests on a device, known as the Device Under Test ( DUT ), using automation to quickly perform measurements and evaluate the test results.

There may also be an Interface Test Adapter ( ITA ), a device just making electronic connections between the ATE and the Device Under Test ( also called Unit Under Test or UUT ), but also it might contain an additional circuitry to adapt signals between the ATE and the DUT and has physical facilities to mount the DUT.

* Pattern Generator, which transmits a defined test pattern to the DUT or test system

* Error detector connected to the DUT or test system, to count the errors generated by the DUT or test system

The " DUT " test connector is defined to enable standardized functional test system interconnection.

Some recent projects being developed at the university include Flame, first humanoid robot possessing the ability to walk as humans, Superbus, project aiming to design a high speed busses reaching the speeds of 250 km / h, Nuna, solar-powered race car and four times winner of the World Solar Challenge, DUT Racing, electrical Formula Student project having won multiple competitions, Delfly, Micro air vehicle and the smallest ornithopter so far fitted with a camera, Fhybrid, world's first hydrogen-powered scooter, Tribler, an open source peer-to-peer client with online TV functionalities, Delfi-C3, CubeSat satellite constructed by TU Delft students, Forze, hydrogen fuel cell-powered racing car, as well as Eco-Runner vehicle participating in Eco-marathon.

Higher energy pulses, such as lightning or nuclear EMP simulations, can require a large current clamp or a large antenna which completely surrounds the DUT.

Radiated emissions must be measured in all directions around the DUT.

It is the extra loss produced by the introduction of the DUT between the 2 reference planes of the measurement.

Notice that the extra loss can be introduced by intrinsic loss in the DUT and / or mismatch.

It describes how fast or slow the DUT responds, and how satisfied or how the user actually perceives performance.

With the support of “ the 985 Project ” and “ the 211 Project ” funded by the State Ministry of Education, Liaoning Province, and Dalian City, DUT is engaged in grasping the historic opportunity of rejuvenating the old northeast industrial base and carrying out a talent-training strategy in the hope of building DUT into a world-famous research-oriented university.

Previously known as Dalian University, DUT was founded in 1949.

In the 1960s DUT had developed into one of the key universities in China.

DUT experienced consistent growth of over half a century, and having gone through the persistent efforts of several generations, DUT has developed into a comprehensive university with a primary emphasis still on science and technology.