* EG-DocRIP ( printer drivers not available ) can interpret several printer languages or document formats-HP PCL5, XL, Adobe PostScript Level3, Microsoft XPS, W3C XHTML-MP, and render to raster image.

XPS is a surface chemical analysis technique that can be used to analyze the surface chemistry of a material in its " as received " state, or after some treatment, for example: fracturing, cutting or scraping in air or UHV to expose the bulk chemistry, ion beam etching to clean off some of the surface contamination, exposure to heat to study the changes due to heating, exposure to reactive gases or solutions, exposure to ion beam implant, exposure to ultraviolet light.

A few, special design, XPS instruments can analyze volatile liquids or gases, materials at low or high temperatures or materials at roughly 1 torr vacuum, but there are relatively few of these types of XPS systems.

Tables of binding energies ( BEs ) that identify the shell and spin-orbit of each peak produced by a given element are included with modern XPS instruments, and can be found in various handbooks and websites.

The board can be sheet metal, plywood, cement or oriented strand board ( OSB ) and the foam either expanded polystyrene foam ( EPS ), extruded polystyrene foam ( XPS ) or polyurethane foam.

SIPs are most commonly made of OSB panels sandwiched around a foam core made of expanded polystyrene ( EPS ), extruded polystyrene ( XPS ) or rigid polyurethane foam, but other materials can be used, such as plywood, pressure-treated plywood for below-grade foundation walls, steel, aluminum, cement board such as Hardibacker, and even exotic materials like stainless steel, fiber-reinforced plastic, and magnesium oxide.

By using an energy filter, a PEEM microscope can be seen as imaging UPS or XPS.

Experimentally, sp < sup > 2 </ sup > to sp < sup > 3 </ sup > ratios can be determined by comparing the relative intensities of various spectroscopic peaks ( including EELS, XPS, and Raman Spectroscopy ) to those expected for graphite or diamond.

Chemical composition and structure of organic semiconductors can be characterized by infrared spectroscopy, secondary ion mass spectrometry ( SIMS ) and X-ray photoelectron spectroscopy ( XPS ).

Sputtering is also used in materials science for extending surface analytical techniques such as secondary ion mass spectrometry or electron spectroscopy ( XPS, AES ) so that they can depth profile them.

The thicknesses of SAMs can be measured using ellipsometry and X-ray photoelectron spectroscopy ( XPS ), which also give information on interfacial properties.

The contents of an XPS file can be examined simply by opening it in an application which supports ZIP files.

XPS documents can be created by printing to the virtual XPS printer driver.

Users who do not wish to view XPS documents in the browser can download the XPS Essentials Pack, which includes a standalone viewer and the XPS Document Writer.

Installing this pack enables operating systems prior to Windows Vista to use the XPS print spooler instead of the GDI-based WinPrint, which can produce better quality prints for printers that support XPS in hardware ( directly consume the format ).

The input may be a page description in a high-level page description language such as PostScript, Portable Document Format, XPS or another bitmap of higher or lower resolution than the output device.

To generate atomic percentage values, each raw XPS signal must be corrected by dividing its signal intensity ( number of electrons detected ) by a " relative sensitivity factor " ( RSF ) and normalized over all of the elements detected.

To count the number of electrons at each kinetic energy value, with the minimum of error, XPS must be performed under ultra-high vacuum ( UHV ) conditions because electron counting detectors in XPS instruments are typically one meter away from the material irradiated with X-rays.

If an insulated slab is to be poured inside the grade beam, then the outer surface of the grade beam and the rubble trench should be insulated with rigid XPS foam board, which must be protected above grade from mechanical and UV degradation.

Spectroscopic image resolution levels of 200 nm or below has been achieved on latest imaging XPS instruments using synchrotron radiation as X-ray source.

Dell followed suit by shipping their XPS computers with liquid cooling, using thermoelectric cooling to help cool the liquid.

Notably, the markup language for XPS is a subset of XAML, allowing it to incorporate vector-graphic elements in documents, using XAML to mark up the Windows Presentation Foundation ( WPF ) primitives.

An XPS file is, in fact, a Unicoded ZIP archive using the Open Packaging Conventions, containing the files which make up the document.

Commercial XPS instruments in the year 2005 used either a highly focused 20 to 200 micrometer beam of monochromatic aluminium Kα X-rays or a broad 10 – 30 mm beam of non-monochromatic ( polychromatic ) magnesium X-rays.

The ability to produce Chemical State information from the topmost 1-12 nm of any surface makes XPS a unique and invaluable tool for understanding the chemistry of any surface either, as received, or after physical or chemical treatment ( s ).

Organic chemicals are not routinely analyzed by XPS because they are readily degraded by either the energy of the X-rays or the heat from non-monochromatic X-ray sources.

The first generation of the XPS system was available as either a desktop or a tower.

The largest panel on the cross ( north side ) shows either Christ treading on the beasts, a subject especially popular with the Anglo-Saxons, or its rare pacific variant Christ as Judge recognised by the beasts in the desert, as suggested by the unique Latin inscription surrounding the panel: " IHS XPS iudex aequitatis ; bestiae et dracones cognoverunt in deserto salvatorem mundi "-" Jesus Christ: the judge of righteousness: the beasts and dragons recognised in the desert the saviour of the world.

The main components of a commercially made XPS system include:

Basic components of a monochromatic XPS system.

An inside view of an old-type, non-monochromatic XPS system.

Designers use XPS ( Xilinx Platform Studio ) to configure and build the hardware specification of their embedded system ( processor core, memory-controller, I / O peripherals, etc.

) The XPS converts the designer's platform specification into a synthesizeable RTL description ( Verilog or VHDL ), and writes a set of scripts to automate the implementation of the embedded system ( from RTL to the bitstream-file.

Common techniques are electron microscopy ( TEM, SEM ), atomic force microscopy ( AFM ), dynamic light scattering ( DLS ), x-ray photoelectron spectroscopy ( XPS ), powder X-ray diffraction ( XRD ), Fourier transform infrared spectroscopy ( FTIR ), matrix-assisted laser desorption / ionization time-of-flight mass spectrometry ( MALDI-TOF ), ultraviolet-visible spectroscopy, dual polarisation interferometry and nuclear magnetic resonance ( NMR ).

XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 1 to 10 nm of the material being analyzed.

* XPS detects all elements with an atomic number ( Z ) of 3 ( lithium ) and above.

Innes experimented with a Röntgen tube, Helmholtz coils, a magnetic field hemisphere ( electron energy analyzer ) and photographic plates to record broad bands of emitted electrons as a function of velocity, in effect recording the first XPS spectrum.

In cooperation with Siegbahn, a small group of engineers ( Mike Kelly, Charles Bryson, Lavier Faye, Robert Chaney ) at Hewlett-Packard in the USA, produced the first commercial monochromatic XPS instrument in 1969.

Because modern systems use monochromatic X-ray sources, XPS measurements leave the surface free of any degradation with few exceptions.

Initially, Dell maintained its competing XPS line of gaming PCs, often selling computers with the same specifications.

For the next 3 years with Vernon Weiss managing the product line, the XPS systems won over 100 magazine reviews and covers, being the first to adopt the latest PC technology available and bring it to the consumers at an attractive price.

For example, the XPS 200 is limited to extremely low-end video cards, while the XPS M140 is only configurable with Intel video, thus making both systems unsuited for gaming or high-end usage.

Initially, Dell maintained the XPS line, often selling computers with the same specifications as those offered by the Alienware division.

* London XPS 643 ( 1974 ): 1st issue, with art, lyrics and credits.

Right: Dell Dimension 4500 ; left: Dell Dimension XPS D266. Dell Dimension was a line of home desktop computers manufactured by Dell Inc. As of June 26, 2007, Dell replaced the low-end Dimension with the Inspiron line of desktop computers, later offering higher-end consumer machines under the Studio line in 2008.

Microsoft has extended this concept with its next-generation XPS format, and printer implementations of XPS are being developed.